Wafer resistance shape measuring machine - LEO Kobelco Research Institute RPW-1000M
Product Specifications
Maker LEO Kobelco Research Institute
Model RPW-1000M
Category Measuring Instruments ・ Instruments
Model year 2004
Condition Used
Showroom Information
Exhibition hall Tsuru Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number F50338
Mechanical Specifications
Target wafer: SiC single crystal wafer
Diameter Φ100mm/Φ125mm/Φ150mm
Thickness: 200-300 μm
Measurement position: Thickness/shape measurement (set by recipe)
Attachments
Product Overview
LEO Kobelco Research Institute RPW-1000M is a used Measuring Instruments ・ Instruments item handled by ASKINDEX Korea. This listing has sold, but you can ask about restock or a similar unit, and request a quote. You can also compare other used products from the same manufacturer (LEO Kobelco Research Institute) and the same category (Measuring Instruments ・ Instruments).
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