Wafer lifetime measurement equipment - LEO Kobelco Research Institute LTA-1800
Product Specifications
Maker LEO Kobelco Research Institute
Model LTA-1800
Category Measuring Instruments ・ Instruments
Model year 2003
Condition Used
Showroom Information
Exhibition hall Tsuru Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number F50340
Mechanical Specifications
1 inch (25 mm) Φ min ~ 200 mm max
Evaluation area: Low-temperature polysilicon SiC only
Thickness: 300~1000μ Specific resistance: 0.02~10Ω/cm
Manual wafer transfer, target product 3C-Sic
Attachments
Product Overview
LEO Kobelco Research Institute LTA-1800 is a used Measuring Instruments ・ Instruments item handled by ASKINDEX Korea. This listing has sold, but you can ask about restock or a similar unit, and request a quote. You can also compare other used products from the same manufacturer (LEO Kobelco Research Institute) and the same category (Measuring Instruments ・ Instruments).
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