Scanning Electron Microscope (SEM) - JEOL JCM-5700
Product Specifications
Maker JEOL
Model JCM-5700
Category Semiconductor (Post-process)
Model year 2007
Condition Used
Showroom Information
Exhibition hall Enzan Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number K80338
Mechanical Specifications
Resolution 5nm ×8~×300,000 Maximum document size 150nm
Drive system: 2-axis motor XY axis: 40/80mm Z axis: 5~48mm R axis: 360° T axis: -10~90° Maximum material size: 150mmΦ Material thickness: 43mm
Elemental analysis function (EDS detector JED-2300)
Attachments
Product Overview
JEOL JCM-5700 is a used Semiconductor (Post-process) item handled by ASKINDEX Korea. This listing has sold, but you can ask about restock or a similar unit, and request a quote. You can also compare other used products from the same manufacturer (JEOL) and the same category (Semiconductor (Post-process)).
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