Scanning Electron Microscope (SEM) - JEOL JCM-5700
Product Specifications
Maker JEOL
Model JCM-5700
Category Semiconductor (Post-process)
Model year 2007
Condition Used
Showroom Information
Exhibition hall Enzan Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number K80338
Product Overview
JEOL JCM-5700 is a used Semiconductor (Post-process) item available from ASKINDEX Korea. It is kept in stock at our Enzan Technical Center showroom, so stock checks and price quotations are available immediately. You can also compare other used products from the same manufacturer (JEOL) and the same category (Semiconductor (Post-process)).
Mechanical Specifications
Resolution 5nm ×8~×300,000 Maximum document size 150nm
Drive system: 2-axis motor XY axis: 40/80mm Z axis: 5~48mm R axis: 360° T axis: -10~90° Maximum material size: 150mmΦ Material thickness: 43mm
Elemental analysis function (EDS detector JED-2300)
Attachments
※ Click on the image below to zoom in.
