Atomic force microscope (AFM) - SII Sia Ainano Technology L-trace Ⅱ
Product Specifications
Maker SII Sia Ainano Technology
Model L-trace Ⅱ
Category Semiconductor (Post-process)
Model year 2012
External Dimensions 900x900x1500
Condition Used
Showroom Information
Exhibition hall Kyushu Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number L70649
Product Overview
SII Sia Ainano Technology L-trace Ⅱ is a used Semiconductor (Post-process) item available from ASKINDEX Korea. External dimensions: 900x900x1500. It is kept in stock at our Kyushu Technical Center showroom, so stock checks and price quotations are available immediately. You can also compare other used products from the same manufacturer (SII Sia Ainano Technology) and the same category (Semiconductor (Post-process)).
model l-trace Ⅱ
year 2012
-> Machine specification sample stage: φ150 (6in)
Scan method D/A converter control
Maximum voltage ± 200V
Scan rotation maximum ± 180 °
Simultaneous measurement maximum 4
AC100 1.5A 50/60Hz
添付ファイル Operation check sheet
※ Click on the image below to zoom in.
