Atomic force microscope (AFM) - SII Sia Ainano Technology L-trace Ⅱ
Product Specifications
Maker SII Sia Ainano Technology
Model L-trace Ⅱ
Category Semiconductor (Post-process)
Model year 2012
External Dimensions 900x900x1500
Condition Used
Showroom Information
Exhibition hall Kyushu Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number L70649
model l-trace Ⅱ
year 2012
-> Machine specification sample stage: φ150 (6in)
Scan method D/A converter control
Maximum voltage ± 200V
Scan rotation maximum ± 180 °
Simultaneous measurement maximum 4
AC100 1.5A 50/60Hz
添付ファイル Operation check sheet
Product Overview
SII Sia Ainano Technology L-trace Ⅱ is a used Semiconductor (Post-process) item handled by ASKINDEX Korea. External dimensions: 900x900x1500. This listing has sold, but you can ask about restock or a similar unit, and request a quote. You can also compare other used products from the same manufacturer (SII Sia Ainano Technology) and the same category (Semiconductor (Post-process)).
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