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Scanning Electron Microscope (SEM) - JEOL JWS-2000

Product Specifications

Maker JEOL

Model JWS-2000

Category Measuring Instruments ・ Instruments

External Dimensions 2200x1400x1800

Condition Used

Showroom Information

Exhibition hall Kyushu Technical Center

Price & Inquiry

price Price Inquiry

Inquiry Number M20453

Product Overview

JEOL JWS-2000 is a used Measuring Instruments ・ Instruments item available from ASKINDEX Korea. External dimensions: 2200x1400x1800. It is kept in stock at our Kyushu Technical Center showroom, so stock checks and price quotations are available immediately. You can also compare other used products from the same manufacturer (JEOL) and the same category (Measuring Instruments ・ Instruments).

Mechanical Specifications

Main unit, main unit, pump, cardboard box, pump power supply

Attachments

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JEOL JWS-2000 Scanning Electron Microscope (SEM) - ASKINDEX Korea

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  • JEOL JWS-2000 Scanning Electron Microscope (SEM) Detail Image - ASKINDEX Korea
  • JEOL JWS-2000 Scanning Electron Microscope (SEM) Detail Image - ASKINDEX Korea
  • JEOL JWS-2000 Scanning Electron Microscope (SEM) Detail Image - ASKINDEX Korea
  • JEOL JWS-2000 Scanning Electron Microscope (SEM) Detail Image - ASKINDEX Korea
  • JEOL JWS-2000 Scanning Electron Microscope (SEM) Detail Image - ASKINDEX Korea
  • JEOL JWS-2000 Scanning Electron Microscope (SEM) Detail Image - ASKINDEX Korea