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Scanning Electron Microscope (SEM) - JEOL JWS-2000

Product Specifications

Maker JEOL

Model JWS-2000

Category Measuring Instruments ・ Instruments

External Dimensions 2200x1400x1800

Condition Used

Showroom Information

Exhibition hall Kyushu Technical Center

Price & Inquiry

price Price Inquiry

Inquiry Number M20453

Mechanical Specifications

Main unit, main unit, pump, cardboard box, pump power supply

Attachments

Product Overview

JEOL JWS-2000 is a used Measuring Instruments ・ Instruments item handled by ASKINDEX Korea. External dimensions: 2200x1400x1800. This listing has sold, but you can ask about restock or a similar unit, and request a quote. You can also compare other used products from the same manufacturer (JEOL) and the same category (Measuring Instruments ・ Instruments).

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JEOL JWS-2000 Scanning Electron Microscope (SEM) - ASKINDEX Korea

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