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Scanning Electron Microscope (SEM) - JEOL JWS-7505

Product Specifications

Maker JEOL

Model JWS-7505

Category Measuring Instruments ・ Instruments

External Dimensions 1700x1400x1800

Condition Used

Showroom Information

Exhibition hall Kyushu Technical Center

Price & Inquiry

price Price Inquiry

Inquiry Number M40878

Mechanical Specifications

1φ 200V 50/60Hz 40A 8kVA

Attachments

Product Overview

JEOL JWS-7505 is a used Measuring Instruments ・ Instruments item handled by ASKINDEX Korea. External dimensions: 1700x1400x1800. This listing has sold, but you can ask about restock or a similar unit, and request a quote. You can also compare other used products from the same manufacturer (JEOL) and the same category (Measuring Instruments ・ Instruments).

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JEOL JWS-7505 Scanning Electron Microscope (SEM) - ASKINDEX Korea

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