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Scanning Electron Microscope (SEM) - JEOL JWS-7505

Product Specifications

Maker JEOL

Model JWS-7505

Category Measuring Instruments ・ Instruments

External Dimensions 1700x1400x1800

Condition Used

Showroom Information

Exhibition hall Kyushu Technical Center

Price & Inquiry

price Price Inquiry

Inquiry Number M40878

Product Overview

JEOL JWS-7505 is a used Measuring Instruments ・ Instruments item available from ASKINDEX Korea. External dimensions: 1700x1400x1800. It is kept in stock at our Kyushu Technical Center showroom, so stock checks and price quotations are available immediately. You can also compare other used products from the same manufacturer (JEOL) and the same category (Measuring Instruments ・ Instruments).

Mechanical Specifications

1φ 200V 50/60Hz 40A 8kVA

Attachments

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JEOL JWS-7505 Scanning Electron Microscope (SEM) - ASKINDEX Korea

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  • JEOL JWS-7505 Scanning Electron Microscope (SEM) Detail Image - ASKINDEX Korea
  • JEOL JWS-7505 Scanning Electron Microscope (SEM) Detail Image - ASKINDEX Korea
  • JEOL JWS-7505 Scanning Electron Microscope (SEM) Detail Image - ASKINDEX Korea
  • JEOL JWS-7505 Scanning Electron Microscope (SEM) Detail Image - ASKINDEX Korea
  • JEOL JWS-7505 Scanning Electron Microscope (SEM) Detail Image - ASKINDEX Korea
  • JEOL JWS-7505 Scanning Electron Microscope (SEM) Detail Image - ASKINDEX Korea