2D film thickness distribution measuring device - JFE Techno-Research FiDiCa（フィディカ）
Product Specifications
Maker JFE Techno-Research
Model FiDiCa（フィディカ）
Category Semiconductor (Post-process)
Model year 2016
External Dimensions W1590 D990 H1750
Condition Used
Showroom Information
Exhibition hall Enzan Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number N70115
Mechanical Specifications
Measurement objects: semiconductors, films, liquid films
Sample size: A3 (300mm x 400mm)
Film thickness measurement range: 100nm to 150um
Measurement resolution: a few nm
Measurement principle: Spectral interferometry, 1-axis scanning
Measurement time: Approximately 90 seconds
Attachments
Product Overview
JFE Techno-Research FiDiCa（フィディカ） is a used Semiconductor (Post-process) item handled by ASKINDEX Korea. External dimensions: W1590 D990 H1750. This listing has sold, but you can ask about restock or a similar unit, and request a quote. You can also compare other used products from the same manufacturer (JFE Techno-Research) and the same category (Semiconductor (Post-process)).
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