2D film thickness distribution measuring device - JFE Techno-Research FiDiCa（フィディカ）
Product Specifications
Maker JFE Techno-Research
Model FiDiCa（フィディカ）
Category Semiconductor (Post-process)
Model year 2016
External Dimensions W1590 D990 H1750
Condition Used
Showroom Information
Exhibition hall Enzan Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number N70115
Product Overview
JFE Techno-Research FiDiCa（フィディカ） is a used Semiconductor (Post-process) item available from ASKINDEX Korea. External dimensions: W1590 D990 H1750. It is kept in stock at our Enzan Technical Center showroom, so stock checks and price quotations are available immediately. You can also compare other used products from the same manufacturer (JFE Techno-Research) and the same category (Semiconductor (Post-process)).
Mechanical Specifications
Measurement objects: semiconductors, films, liquid films
Sample size: A3 (300mm x 400mm)
Film thickness measurement range: 100nm to 150um
Measurement resolution: a few nm
Measurement principle: Spectral interferometry, 1-axis scanning
Measurement time: Approximately 90 seconds
Attachments
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