Scanning Electron Microscope - JEOL JSM-IT300LA
Product Specifications
Maker JEOL
Model JSM-IT300LA
Category Measuring Instruments ・ Instruments
Model year 2016
Condition Used
Showroom Information
Exhibition hall Enzan Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number N90304
Mechanical Specifications
Magnification: x5 to x300,000
EDS detectable elements: Be to U
Sample movement method: 5 axes (X, Y, Z, R, T)
Sample movement range: X=125mm/Y=100mm/Z=WD5-48mm (focus range)/tilt=-10°-90°/rotation=360°
Vacuum pump: G-100DB x 2
Printer: SPC250L
Power supply: AC100V 50/60Hz
Attachments
Product Overview
JEOL JSM-IT300LA is a used Measuring Instruments ・ Instruments item handled by ASKINDEX Korea. This listing has sold, but you can ask about restock or a similar unit, and request a quote. You can also compare other used products from the same manufacturer (JEOL) and the same category (Measuring Instruments ・ Instruments).
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