Scanning Electron Microscope - JEOL JSM-IT300LA
Product Specifications
Maker JEOL
Model JSM-IT300LA
Category Measuring Instruments ・ Instruments
Model year 2016
Condition Used
Showroom Information
Exhibition hall Enzan Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number N90304
Product Overview
JEOL JSM-IT300LA is a used Measuring Instruments ・ Instruments item available from ASKINDEX Korea. It is kept in stock at our Enzan Technical Center showroom, so stock checks and price quotations are available immediately. You can also compare other used products from the same manufacturer (JEOL) and the same category (Measuring Instruments ・ Instruments).
Mechanical Specifications
Magnification: x5 to x300,000
EDS detectable elements: Be to U
Sample movement method: 5 axes (X, Y, Z, R, T)
Sample movement range: X=125mm/Y=100mm/Z=WD5-48mm (focus range)/tilt=-10°-90°/rotation=360°
Vacuum pump: G-100DB x 2
Printer: SPC250L
Power supply: AC100V 50/60Hz
Attachments
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