Wavelength phase difference and transmittance measuring device - AxoScan
Product Specifications
Maker
Model AxoScan
Category Semiconductor (Post-process)
External Dimensions W2000+95 D1200 H795+900
Condition Used
Showroom Information
Exhibition hall Enzan Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number O40395
Mechanical Specifications
Rapid measurement of the Mueller matrix of a sample and the optical properties of the sample are derived
Optical experiment table with stand: HA-2012-150L (Sigma Koki)
Attachments
Product Overview
AxoScan is a used Semiconductor (Post-process) item handled by ASKINDEX Korea. External dimensions: W2000+95 D1200 H795+900. This listing has sold, but you can ask about restock or a similar unit, and request a quote.
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