scanning electron microscope - JEOL JIB4501
Product Specifications
Maker JEOL
Model JIB4501
Category Measuring Instruments ・ Instruments
Model year 2013
Condition Used
Showroom Information
Exhibition hall Enzan Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number PA0245
Mechanical Specifications
FIB (Focused Ion Beam)
Ion source: Ga liquid metal ion source
Acceleration voltage: 1 to 30 kV (steps)
Magnification: x30 (for finding the field of view)
×100 to ×300,000
Image resolution: 5nm (at 30kV)
Maximum beam current: 60 nA (at 30 kV)
Adjustable aperture: 12 stops (motor driven)
Ion beam processing shape: Rectangular, line, spot
SEM (electron beam)
Beam source: LaB6
Acceleration voltage: 0.3 to 30 kV (steps)
Magnification: ×5 to 300,000
Image resolution: 2.5nm (at 30kV)
Maximum beam current: 1 μA (at 30 kV)
Sample stage: Goniometer stage
X: 76mm, Y: 76mm
Z: 5 to 48 mm
T: -10 to 90°, R: 360°
R: 360° endless
Maximum sample size: 76mmφ
Attachments
Product Overview
JEOL JIB4501 is a used Measuring Instruments ・ Instruments item handled by ASKINDEX Korea. This listing has sold, but you can ask about restock or a similar unit, and request a quote. You can also compare other used products from the same manufacturer (JEOL) and the same category (Measuring Instruments ・ Instruments).
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