scanning electron microscope - JEOL JIB4501
Product Specifications
Maker JEOL
Model JIB4501
Category Measuring Instruments ・ Instruments
Model year 2013
Condition Used
Showroom Information
Exhibition hall Enzan Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number PA0245
Product Overview
JEOL JIB4501 is a used Measuring Instruments ・ Instruments item available from ASKINDEX Korea. It is kept in stock at our Enzan Technical Center showroom, so stock checks and price quotations are available immediately. You can also compare other used products from the same manufacturer (JEOL) and the same category (Measuring Instruments ・ Instruments).
Mechanical Specifications
FIB (Focused Ion Beam)
Ion source: Ga liquid metal ion source
Acceleration voltage: 1 to 30 kV (steps)
Magnification: x30 (for finding the field of view)
×100 to ×300,000
Image resolution: 5nm (at 30kV)
Maximum beam current: 60 nA (at 30 kV)
Adjustable aperture: 12 stops (motor driven)
Ion beam processing shape: Rectangular, line, spot
SEM (electron beam)
Beam source: LaB6
Acceleration voltage: 0.3 to 30 kV (steps)
Magnification: ×5 to 300,000
Image resolution: 2.5nm (at 30kV)
Maximum beam current: 1 μA (at 30 kV)
Sample stage: Goniometer stage
X: 76mm, Y: 76mm
Z: 5 to 48 mm
T: -10 to 90°, R: 360°
R: 360° endless
Maximum sample size: 76mmφ
Attachments
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