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Flying Probe Tester - Hioki E.E. FA1283-11

Product Specifications

Maker Hioki E.E.

Model FA1283-11

Category Semiconductor (Post-process)

Model year 2021

Condition Used

Showroom Information

Exhibition hall Enzan Technical Center

Price & Inquiry

price Price Inquiry

Inquiry Number Q30037

Product Overview

Hioki E.E. FA1283-11 is a used Semiconductor (Post-process) item available from ASKINDEX Korea. It is kept in stock at our Enzan Technical Center showroom, so stock checks and price quotations are available immediately. You can also compare other used products from the same manufacturer (Hioki E.E.) and the same category (Semiconductor (Post-process)).

Mechanical Specifications

Transportable board dimensions (WxD): 50 x 40 to 400 x 330 mm / thickness 0.1 to 2.5 mm

Measurement items: Resistance/Capacitance/Inductance/Diode VF/Zener Diode VZ, etc.

Body dimensions: 1390 x 1360 x 1670

Loader dimensions: 1950x910x1980

Power supply: Single-phase AC200V 50/60Hz

Attachments

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Hioki E.E. FA1283-11 Flying Probe Tester - ASKINDEX Korea

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  • Hioki E.E. FA1283-11 Flying Probe Tester Detail Image - ASKINDEX Korea
  • Hioki E.E. FA1283-11 Flying Probe Tester Detail Image - ASKINDEX Korea
  • Hioki E.E. FA1283-11 Flying Probe Tester Detail Image - ASKINDEX Korea
  • Hioki E.E. FA1283-11 Flying Probe Tester Detail Image - ASKINDEX Korea
  • Hioki E.E. FA1283-11 Flying Probe Tester Detail Image - ASKINDEX Korea
  • Hioki E.E. FA1283-11 Flying Probe Tester Detail Image - ASKINDEX Korea