Focused ion beam NG sample preparation equipment - JEOL Datum JEM-9310FIB
Product Specifications
Maker JEOL Datum
Model JEM-9310FIB
Category Semiconductor (Post-process)
Model year 2008
Condition Used
Showroom Information
Exhibition hall Enzan Technical Center
Price & Inquiry
price Price Inquiry
Inquiry Number TF1SA1
Mechanical Specifications
Ion source: Ga liquid metal ion source
Acceleration voltage: 5 to 30 kV (5 kV steps)
Ion beam processing shape: rectangle, line, spot
Magnification: x50 (viewpoint search) x150~300,000
Attachments
Product Overview
JEOL Datum JEM-9310FIB is a used Semiconductor (Post-process) item handled by ASKINDEX Korea. This listing has sold, but you can ask about restock or a similar unit, and request a quote. You can also compare other used products from the same manufacturer (JEOL Datum) and the same category (Semiconductor (Post-process)).
※ Click on the image below to zoom in.